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JEOL JEM-ARM200F TEM (0.8 Å res.)

eagle-i ID

http://utsa.eagle-i.net/i/00000137-e231-ddfd-4d36-56dd80000000

Resource Type

  1. Transmission electron microscope

Properties

  1. Resource Description
    This aberration corrected transmission electron microscope has a resolution of 0.8 Angstroms in STEM mode. It is also fitted with an EELS Gatan Tridium spectrometer, an EDS X-ray detector, and is capable of holography.
  2. Contact
    Ponce-Pedraza, Arturo, Ph.D.
  3. Manufacturer
    JEOL Ltd.
  4. Model Number
    JEM-ARM200F
  5. Website(s)
    http://www.jeolusa.com/PRODUCTS/ElectronOptics/TransmissionElectronMicroscopesTEM/200kV/JEMARM200F/tabid/663/Default.aspx
  6. Related Technique
    Scanning electron microscopy
  7. Related Technique
    Energy-dispersive X-ray spectroscopy
  8. Related Technique
    Electron energy loss spectroscopy
  9. Location
    Kleberg Advanced Microscopy Laboratory
 
RDFRDF
 
Provenance Metadata About This Resource Record
  1. workflow state
    Published
  2. contributor
    nvasilevsky
  3. contributor
    efleming
  4. created
    2012-06-12T14:37:26.298-05:00
  5. creator
    efleming
  6. modified
    2012-10-29T21:25:50.917-05:00

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The eagle-i Consortium is supported by NIH Grant #5U24RR029825-02 / Copyright 2016