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JEOL JEM-ARM200F TEM (0.8 Å res.)

http://utsa.eagle-i.net/i/00000137-e231-ddfd-4d36-56dd80000000

Resource Description

This aberration corrected transmission electron microscope has a resolution of 0.8 Angstroms in STEM mode. It is also fitted with an EELS Gatan Tridium spectrometer, an EDS X-ray detector, and is capable of holography.
Contact

Ponce-Pedraza, Arturo, Ph.D.
Manufacturer

JEOL Ltd.
Model Number

JEM-ARM200F
Website(s)

http://www.jeolusa.com/PRODUCTS/ElectronOptics/TransmissionElectronMicroscopesTEM/200kV/JEMARM200F/tabid/663/Default.aspx
Related Technique

Scanning electron microscopy
Related Technique

Energy-dispersive X-ray spectroscopy
Related Technique

Electron energy loss spectroscopy
Location

Kleberg Advanced Microscopy Laboratory

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