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JEOL JEM-ARM200F TEM (0.8 Å res.)

eagle-i ID

http://utsa.eagle-i.net/i/00000137-e231-ddfd-4d36-56dd80000000

Resource Type

  1. Transmission electron microscope

Properties

  1. Resource Description
    This aberration corrected transmission electron microscope has a resolution of 0.8 Angstroms in STEM mode. It is also fitted with an EELS Gatan Tridium spectrometer, an EDS X-ray detector, and is capable of holography.
  2. Contact
    Ponce-Pedraza, Arturo, Ph.D.
  3. Manufacturer
    JEOL Ltd.
  4. Model Number
    JEM-ARM200F
  5. Website(s)
    http://www.jeolusa.com/PRODUCTS/ElectronOptics/TransmissionElectronMicroscopesTEM/200kV/JEMARM200F/tabid/663/Default.aspx
  6. Related Technique
    Scanning electron microscopy
  7. Related Technique
    Energy-dispersive X-ray spectroscopy
  8. Related Technique
    Electron energy loss spectroscopy
  9. Location
    Kleberg Advanced Microscopy Laboratory
 
RDFRDF
 
Inferred Types from the eagle-i Ontology (What is an ontology?)
Provenance Metadata About This Resource Record
  1. workflow state
    Published
  2. contributor
    nvasilevsky
  3. contributor
    efleming
  4. created
    2012-06-12T14:37:26.298-05:00
  5. creator
    efleming
  6. modified
    2012-10-29T21:25:50.917-05:00
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The eagle-i Consortium is supported by NIH Grant #5U24RR029825-02 / Copyright 2016