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JEOL JEM-ARM200F TEM (0.8 Å res.)
eagle-i ID
http://utsa.eagle-i.net/i/00000137-e231-ddfd-4d36-56dd80000000
Resource Type
Properties
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Resource Description
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This aberration corrected transmission electron microscope has a resolution of 0.8 Angstroms in STEM mode. It is also fitted with an EELS Gatan Tridium spectrometer, an EDS X-ray detector, and is capable of holography.
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Contact
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Ponce-Pedraza, Arturo, Ph.D.
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Manufacturer
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JEOL Ltd.
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Model Number
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JEM-ARM200F
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Website(s)
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http://www.jeolusa.com/PRODUCTS/ElectronOptics/TransmissionElectronMicroscopesTEM/200kV/JEMARM200F/tabid/663/Default.aspx
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Related Technique
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Scanning electron microscopy
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Related Technique
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Energy-dispersive X-ray spectroscopy
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Related Technique
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Electron energy loss spectroscopy
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Location
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Kleberg Advanced Microscopy Laboratory
